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耗材系列

Allround Trading co., Ltd. PRODUCTS

chapman

MPT1000

.Non-contact, providing non-destructive thickness measurements .
.0.1 um thickness resolution, providing thickness uniformity and Q/C control .
.TTV, Bow & Warp, Bump Wafer, Tape Wafer
MPS

.Fully automated wafer handling system
.Integrated vibration air isolation system
.Automated Objective changer
.Wafer planar and edge measurements
MP2100

.Non-contact measurement
.Roughness and waviness from a single scan
.Semiconductor
.Optics
MP2200

.Sub-Angstrom height resolution (0.01nm)
.Wafer planar and edge measurements
.Scan lengths from sub micron to 100 mm
.50 nm Sampling
.Data Storage
SCREEN,VEECO,SSEC
LIFT OFF,IGBT,VCSEL,PD
撕金機,POWER IC,功率半導體,SAW filter,LD,光電二級體
MEMS,3D感測,Fan-out wafer-level,packageing,FO-WLP
PA,GaN,GaAS,SIC,微波通訊晶片

SPIN,COATER,HEMT,High uniformity,square substrate
全自動 6" 8" 云膠機,高黏稠度,云胶厚度均勻,方形基板
全自動 6" 8" 塗膠機,TOK SUSS,ELS,億力鑫

MASK ALIGNER,Proximity exposure,接近式曝光,Soft contact exposure,軟接觸曝光
半自動光刻機,SUSS,MYCRO,N&Q,Hard contact exposure,硬接觸曝光
掩模對準曝光機

NON CONTACT MEASUREMENT THICKNESS,非接觸厚度量測,德國 ISIS,SENTRONICS,SEMDEX,FSM
光學測量系統,Optical Semiconductor
BOW,Warp,Bump height,TSV via depth,Coating thickness,Film thickness

NON CONTACT MEASUREMENT ROUGHNESS
光學測量系統,Optical Semiconductor
Roll Off,Edge Chip Detection,wafer nanotography
PFA,結晶皿,硅片 wafer,防腐蝕,特氟龍,鐵氟龍,PFA,蝕刻 etching,entegris,結晶皿,crystalizing dish 吊籃,硅片,wafer,蝕刻 etching,entegris,碎片,吊籃,半導體花籃,Dipper Basket PFA 立式花籃,,圓形立式花籃,半導體花籃 PFA cassette,cassette 耐酸鹼抗高溫金屬cassette,耐酸鹼抗高溫金屬,wafer baking cassette